Optical emission spectrometer OBLF VeOS

Optical emission spectrometer OBLF VeOS

The OBLF VeOS optical emission spectrometer is a versatile, flexible and fast analyzer of all common metallic materials. The VeOS spectrometer uses the most advanced detector technology based on semiconductor sensors specifically designed for emission spectroscopy. Analytical capabilities provide accurate analysis of short wavelength elements such as nitrogen or low carbon.

The OBLF VeOS instrument is the first stationary emission spectrometer based on a semiconductor sensora system whose analytical capabilities, including the spectral resolution required for a laboratory spectrometer, are by no means inferior to instruments based on reliable photomultipliers. Here, for the first time, photosensors with excellent characteristics were used for the required wavelength range - from 130 to 780 nm. The design of CMOS photosensitive detectors has been specially adapted to the requirements of emission spectrometry. They feature a large photosensitive surface that is 100 times larger than comparable systems. OBLF VeOS spectrometers also use special Hamamatsu CCD matrices. As a result, the instrument combines the best combination of spectral sensitivity and spectral resolution with maximum flexibility for solving analytical problems.

In addition to this, the VeOS model is housed in a new operator-friendly housing. For guaranteed protection from external influences at the installation site, a specially designed reading system is placed in a thermally stabilized optical vacuum system. Thermal stabilization of the vacuum chamber frame at +9°С reduces the background level. Maintaining the temperature is provided by an industrial refrigeration plant through the circulation of coolant.

Like all OBLF spectrometers, the VeOS model uses a maintenance-free GDSI digital generator , which, combined with a short analysis time, allows you to optimize the spark discharge parameters for any application. Thanks to OBLF's patented automatic pulse purge system, an improved low-maintenance open spark rack, the instrument's operation is low cost. The new Windows® oriented OBLFwin software makes it easy to operate the spectrometer and offers all the usual setup required for spark spectroscopy.

Advantages of the OBLF VeOS Optical Emission Spectrometer:

  • Versatile and flexible to suit all analytical needs
  • Easily added analytical lines
  • Latest, specially developed sensor technology
  • Superior performance due to limit of detection, accuracy and stability
  • Robust design for tough environments
  • Comprehensive multi-matrix system without any restrictions in the choice of elements for analysis
  • Accurate determination of N and low C (ULC)

Characteristics

Paschen-Runge otic scheme 500 mm
flat grate 160 mm
grating resolution 2600 lines/mm
Inverse dispersion for 1st order 0.78 and ~4 nm/mm
Wavelength range 130-680/780 nm
Spark discharge frequency 1 - 1000 Hz
Argon purity 99.998%
Argon consumption per one burn in Fe-matrix Max. 2.4 l
Argon consumption during waiting capillary
Instrument dimensions, L x W x H 1150 x 740 x 1340 mm
Net weight 300 kg

Equipment request