For in-depth research work and obtaining high-resolution images in the field of semiconductor industry, nanotechnology, materials science, it is necessary to use a device for an ultrathin sample by passing an electron beam through it. The transmission electron microscope is excellent for solving these problems. Such devices are used in the work of many research institutes, enterprises, biomedical laboratories, etc.

The device is aimed at solving analytical problems. The presented models obtain filtered images and electronic spectra without significant energy losses. The equipment receives the necessary data without distortion due to the use of a reliable optical-electronic system.