SE 800 - spectroscopic UV-VIS (UV-VIS) ellipsometer manufactured by SENTECH Instruments GmbH (Germany) with the ability to measure films at different angles is designed for high-precision measurement of the thickness and optical characteristics of both single-layer films and multilayer film structures (refractive index, index absorption) on various types of surfaces. Measurement of nanofilms. Spectral range: 380 (190) - 1000 (2500 or 3500) nm.

SE 800 - UV-VIS spectroscopic ellipsometer is specially designed for research with the ability to measure the thickness of single and multilayer films and film structures at various angles and to measure the optical characteristics of film structures (refractive index, absorption index) on various types of surfaces in UV and visible wavelength range (380 - 1000 nm.) with the possibility of expanding the spectral range up to 190 - 2500 (3500) nm.