SE 850 - spectroscopic UV-VIS-IR (UV-VIS-NIR) ellipsometer manufactured by SENTECH Instruments GmbH (Germany) with the ability to measure films at different angles is designed for high-precision measurement of the thickness and optical characteristics of both single-layer films and multilayer film structures ( refractive index, absorption index) on various types of surfaces. Measurement of nanofilms. Spectral range: 240 - 2500 (3500) nm
SE 850 is the latest UV-VIS-NIR (UV-VID-IR) spectroscopic ellipsometer specially designed for research with the ability to measure the thickness of single- and multilayer films and film structures at various angles and to measure the optical characteristics of film structures (refractive index, index absorption) on various types of surfaces in the UV and visible wavelength range (240 - 2500 nm.) with the possibility of expanding the spectral range up to 190 - 2500 (3500) nm.

Options:

200 µm. microspot (spot focusing) and up to 100 µm on request.
Computer controlled motorized goniometer (40-90º), optional (20-90º) Stage
with manual xy adjustment (travel - 150 mm) for mapping (mapping)
Computer controlled motorized specimen stages for samples up to 300 mm in diameter and movement
Cryostat 4 - 700 ºK
Video camera for sample alignment instead of eyepiece with image output and PC.
Autofocus in combination with a motorized sample
stage Reflectometer (Film Thickness Probe) FTPadv with a spot diameter of 80 µm.
Simulation Software
Liquid Cell
Heated Stage
IR Spread Spectrum Transmission
Measurement
Measurement of the 16-digit Mueller matrix