TTRAX III - heavy-duty X-ray diffractometer (XRD) with a horizontal arrangement of the test sample and with a horizontal arrangement of the test sample manufactured by RIGAKU (Japan)

For more than 50 years, the Japanese company Rigaku Corporation (Rigaku) ​​has been specializing in the production of X-ray diffractometers. Thanks to experience, innovative design solutions, high level of production, RIGAKU has become a world leader in X-ray spectrometry, diffraction, X-ray optics and molecular and protein crystallography. A large number of models of devices manufactured by RIGAKU allow you to choose the one that best meets the needs of the user. This determines the great popularity of RIGAKU equipment all over the world.


TTRAX III - Theta - Theta diffractometer with a powerful X-ray tube with a rotating anode. TTRAX III is the most powerful Theta-Theta X-ray diffractometer in the world. A distinctive feature of the system is an 18 kW rotating anode, with the help of which the problems of determining the phases of low concentrations and studying thin films are easily solved. To ensure the solution of various problems without additional system setup, a convenient Theta-Theta goniometer design was used in combination with parallel beam optics (Cross Beam Optical technology, CBO) and an independent axis for diffraction analysis in the sample plane.

TTRAX is the world's first diffraction system based on a powerful 18 kW X-ray source in q/q configuration. In such a system, the surface of the analyzed sample always remains in a horizontal position, while the anode and detector move along scan angles q/q around the sample. Such a system makes it possible to analyze free liquids at room temperature, as well as melts obtained, for example, in a high-temperature attachment.

The TTRAX goniometric system can be effectively used to determine the radial distribution functions of liquids and melts, study the structure of surface boundaries, and study the transformations of the crystal structure in materials during high-temperature heating.
Standard X-ray powder diffraction is greatly simplified by minimizing sample preparation. Various detectors can be used depending on the need and specifics of this or that analysis. The optimal detector can be selected from scintillation (SC), semiconductor, Peltier cooled, solid state (SSD), curved position sensitive (Inel PSD) detectors, or “imaging plate” systems. Various diffraction attachments are also widely available.

Features of the TTRAX III diffractometer:
1. Theta-Theta design for horizontal sample setup
2. High intensity x-ray emission from x-ray tube with 18 kW rotating anode
3. Choice between the parallel beam optics configuration and the Bragg-Brentano configuration without retuning the system.
4. Independent axis for diffraction analysis in the plane of the sample, applied without additional adjustment.
5. High Resolution Optics 6. CBO (Cross Beam Optics) Small
Angle Scattering Module / The instrument is equipped with cross beam optics. The innovative versatile optical module makes it extremely easy to switch between different optical geometries: Focusing Method, Multilayer Film Parallel Beam Method, Small Angle X-Ray Scattering, Microscopic Sizes, Reflection, High Resolution Thin Film, In-Plane. (Everything except the focusing system is available as an option). Japan Patent No. 3548556.



The parallel X-ray beam is formed by a multilayer parabolic mirror (patented technology CBO - cross beam optics). The module for forming such a beam is always installed, aligned and ready to work - the choice of parallel or focusing geometry of the analysis is carried out with one movement of the hand. It is possible to install a CBO module that makes it extremely easy to switch the focusing (Bragg-Brentano) optical system to the optical system of a parallel beam of rays of a multilayer film mirror, as well as corresponding to 5 types of optical systems: focusing optical system, parallel beam optical system, small angles, microscopic sizes and high resolution. (Japanese Patent No. 3548556).

In-plane / In-plane analysis (option)
An in-plane scattering attachment with detector rotation parallel to the surface of the analyzed sample also expands the possibilities of thin film analysis. While most laboratory studies are carried out in standard geometries, synchrotron analysis has the advantage of being a scattering method for obtaining information directly from the surface of a thin film sample. As films become thinner, X-ray diffraction methods in standard geometry either provide weak information or confusing information due to small crystallite sizes or amorphous structures. Many properties of materials are due to the state of the structure in the plane, rather than from the structure in the direction transverse to it.
With the advent of the Ultima III diffractometer, in-plane diffraction studies can now be performed in the laboratory. Such studies can help in constructing the function of the phase composition over the depth of the analyzed layer, in determining the preferential orientations, internal stresses, etc. There is no need to change such an attachment for standard experiments, it is enough to change the system of slots.
Ultima III Rigaku, like the younger models, has the ability to quickly change the focusing scheme: divergent / parallel beam. The new cross optics (combined optical system) developed by Rigaku allows either one or the other focusing scheme to be used in a single optical module. And the change of schemes occurs with one quick turn of the focusing mirror from a curved surface to a flat one without any other additional hardware restructuring.

For the first time in the world, measurements of small-angle scattering of horizontal samples were implemented.
Small-angle scattering measurements with a high P/B (peak/background) ratio are made possible by monochromatic, high-brightness incoming beams obtained with a multilayer film mirror. Working with the device is also facilitated by the fact that the adjustment is fully automated.

Main technical characteristics: