The DDCOM X-ray diffractometer for determining the orientation in single crystals using the Omega-scanning tool allows one revolution in a short time, up to 5 seconds and with a high accuracy of up to 1/100 ° to determine the orientation of the crystal lattice in 3D, which is 200 times faster than the common Tehta-scan method. scan (Theta scan)

Peculiarities

1. Automatic, high-precision determination of the full orientation of the lattice of a single crystal in 3D.
2. High productivity (more than 250 samples per shift) and reliability allows it to be used in industry for mass production 24 hours a day, 7 days a week.
3. The modularity of the design makes it possible to design and manufacture automated complexes for determining the orientation for specific customer tasks, the development of automatic sample preparation devices, special equipment and sample holders.
4. Convenient and easy to operate.
5. Low operating costs.
6. Azimuth settings and crystal orientation marking
7. High accuracy up to 1/100°
8. Latest and user-friendly software
9. Suitable for a wide range of sample sizes and weights: platinum 1" ÷ 12", crystals up to 20 kg, (single crystals up to 400 mm long can be measured.)
10. Allows you to measure materials:
    • Ag, Au, Ni, Pt
    • Cube / random unknown orientation: Si, Ge, GaAs, GaP, AlAs, AlP, InP, NaCl, AgCl, CaF ₂
    • Cube / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, Si ₃ C, PbS, PbTe, SnTe, MgO, LiF, MgAl ₂ O ₄ , SrTiO ₃ , LaTiO ₃
    • Hexagonal / Trigonal: silicon carbide SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO ₃ , SiO ₂ (quartz), Al ₂ O ₃ (sapphire), GAPO ₄ , La ₃ Ga ₅ SiO ₁₄
    • Rhombic: Mg ₂ SiO ₄ , NdGaO ₃
    • Other materials according to customers' requirements
11. Suitable for research and product quality control.