The Omega/Theta X-ray diffractometer is a fully automated vertical three-axis diffractometer for orientation determination in various crystals using the Omega scan method and rocking curve determination using the Theta scan method.

Specifications

With this diffractometer, it is possible to carry out a complete and accurate determination of the orientation of the crystal lattice in single crystals of complex shape, i.e. having a curved or curved surface (turbine blades, rods, etc.), the ability to determine the orientation both by the Omega-scan method and by the Theta-scan method S (lateral reflex) and method C (centric).

Peculiarities

1. Fully automated measurement of the lattice orientation of single crystals
2. Ultrafast Crystal Orientation Measurement Using the Omega Scan Method
3. Acceleration of measurement by Theta-scan method, due to the initial simplified Omega-scan, in which all peaks are determined (measurement time of the order of 1-4 minutes per sample).
4. Automatic rocking curve measurement for crystal quality evaluation
5. Special software allows you to move from method to method manually or automatically
6. Diffractometer angular resolution: 0.1 arc sec.
7. Sample size up to 450 mm
8. Allows you to measure materials:
   • Ag, Au, Ni, Pt
   • Cube / random unknown orientation: Si, Ge, GaAs, GaP, AlAs, AlP, InP, NaCl, AgCl, CaF ₂
   • Cube / special orientation: Ag, Au, Ni, Pt, GaSb, InAs, InSb, AlSb, ZnTe, CdTe, Si ₃ C, PbS, PbTe, SnTe, MgO, LiF, MgAl ₂ O ₄ , SrTiO ₃ , LaTiO ₃
   • Hexagonal / Trigonal: silicon carbide SiC 2H, 4H, 6H, 15R, GaN, ZnO, LiNbO ₃ , SiO ₂ (quartz), Al ₂ O ₃ (sapphire), GAPO ₄ , La ₃ Ga ₅ SiO ₁₄
   • Rhombic: Mg ₂ SiO ₄ , NdGaO ₃
   • Other materials according to customers' requirements
9. Suitable for research and product quality control

Special Applications

• Determining the orientation of turbine blades
• Determination of lattice parameters of [(Si, Ge) solid solutions]
• High resolution diffraction (reciprocal lattice display) 

Options (accessory)

• Laser scanning system for sample shape measurement
• Camera and image processing for flatness and projections
• Additional sample rotation axis for 3D display
• Secondary channel collimator (analyzer)
• Optional X and Y positioning system
• Automatic sample loading system
• Positioning clamping device for samples with measured orientation for subsequent cutting on the machine

The diffractometer can be equipped with a robotic system for loading and controlling the orientation of samples (seeds, cones of turbine blades and rods) in holders on plates (cassettes) and a position-clamping device for subsequent cutting on the machine.