D/MAX RAPID II - X-ray microdiffraction (XRD) system with a curved spatial detector (two-dimensional X-ray diffractometer) manufactured by RIGAKU (Japan)

For more than 50 years, the Japanese company Rigaku Corporation (Rigaku) ​​has been specializing in the production of X-ray diffractometers. Thanks to experience, innovative design solutions, high level of production, RIGAKU has become a world leader in X-ray spectrometry, diffraction, X-ray optics and molecular and protein crystallography. A large number of models of devices manufactured by RIGAKU allow you to choose the one that best meets the needs of the user. This determines the great popularity of RIGAKU equipment all over the world.

D/MAX RAPID II– a diffractometer for solving a wide range of problems: powder diffractometry, microdiffraction, X-ray scattering at large angles, analysis of the structure and residual stresses, and study of the structure of single crystals. The diffractometer is equipped with a curved two-dimensional detector (Image Plate) and two types of tubes: 3 kW or high-intensity 1.2 kW.
The ability to analyze samples as small as 10 microns makes this system ideal for the non-destructive identification of small particles in a variety of samples. The D/MAX RAPID II is equipped with a zoomable CCD camera that can image sample areas as small as 1 micron.
XY - mapping allows you to determine the exact location of inclusions in large samples.
Applications - geology, process control in semiconductors, forensic science, etc.

D / MAX-RAPID - Rigaku's powerful breakthrough in the production of microdiffractometers.
The curved spatial detector provides high sensitivity, speed and a large analyzed area in comparison with multichannel and CCD technologies for detecting a diffracted beam.
D/MAX-RAPID is many times more capable than other detection systems.
Based on the tried and tested IP technology widely used in biomolecular crystallography and pioneered by Rigaku back in 1988, Rigaku has applied this experience to the development of detection systems for materials science research and has risen to a height in workmanship that is unattainable today. moment for competitors.

The spatial detector D/MAX-RAPID with dimensions of 465 x 256 mm covers a range of 2q angles of more than 200° in the horizontal plane, which makes it possible to detect a fairly wide area of ​​Debye rings.
The system can be configured with either a sealed tube X-ray generator or the much more powerful UltraX-18 rotating anode source, with any characteristic radiation available: Cu, Mo, Cr or Co.
With a dynamic range of 1x106, D/MAX-RAPID exceeds the limit currently unattainable by other spatial detectors.

The parallel beam optical system makes it possible to measure any sample that can be placed on the stage. The kit includes a standard holder for powder samples, as well as holders for bulk, film, and also textured samples, samples of small quantities and small thicknesses.

Thanks to a variety of collimators with a diameter of 30-800 microns, measurements of ultra-small areas of the sample are possible. By integrating the Debye rings obtained on the Imaging Plate, it is possible to carry out an experimental-computational analysis of the contribution to the diffraction of crystals of even an extremely small amount of samples.

The optional XY stage, in addition to the measurements carried out by the previous model at points with specified XY coordinates (mapping measurement), has a revolutionary function that measures each point simply indicated on the monitor.

In addition to measurements of a conventional X-ray diffractometer, it is possible to measure the residual stress of microscopic parts of the sample, pole measurements, high-temperature measurements.
 

Features and benefits of the model:

Large active detection area
465 mm x 256 mm.

limiting dynamic range
1x106 with double PMT.

High sensitivity
1 photon/pixel.

Active pixel size selection
100 µm x 100 µm,
100 µm x 150 µm, or
200 µm x 200 µm
(specified in the control program).

Variety of collimators
0.3mm, 0.5mm, 1.0mm, 3.0mm and 5.0mm.

State-of-the -art goniometer

Large selection of attachments
for determining stresses and strains
for analyzing layered structures
, etc.
 

Main technical characteristics: