NANO-Viewer - small X-ray scattering diffractometer for nanoscale X-ray diffraction analysis (XRD) manufactured by RIGAKU (Japan)

For more than 50 years, the Japanese company Rigaku Corporation (Rigaku) ​​has been specializing in the production of X-ray diffractometers. Thanks to experience, innovative design solutions, high level of production, RIGAKU has become a world leader in X-ray spectrometry, diffraction, X-ray optics and molecular and protein crystallography. A large number of models of devices manufactured by RIGAKU allow you to choose the one that best meets the needs of the user. This determines the great popularity of RIGAKU equipment all over the world.

Small Angle X-Ray Scattering (SAXS) is a non-destructive method for analyzing particle sizes and pore sizes from 1 to 100 nm in various materials.
NANO-Viewer is a complex device for studying X-ray scattering at small angles. It consists of a microfocus X-ray generator with a rotating anticathode and a focusing mirror. To obtain information about nanoscale structures, a two-dimensional detector (Image Plate) is used.

Thanks to nanotechnologies, such new materials as genomes (proteins), semiconductor materials, high-polymer materials, environmental materials, etc., have begun to find application in various fields of activity. The NANO-Viewer (Small Angle X-Ray Scattering Measuring Instrument) analyzes these advanced materials from the molecular level (1nm ~ 100nm macrostructure) to the atomic level (0.2nm ~ 1nm microstructure).

Specification and characteristics of the device

By observing the change in structure under the influence of temperature, humidity and magnetic field, it is possible to characterize the functional properties of materials. For example, it is possible to characterize the structure of an ion-exchange membrane of a fuel cell (temperature and humidity), liquid crystals (temperature and magnetic field), copolymers of high-polymer materials (temperature and concentration), etc.

It became possible to characterize the functional properties of biomaterials, difficult to implement with previous laboratory instruments, to characterize thin films in a plane by the small-angle scattering method, and to characterize the self-organization of ultrasmall particles.

Thanks to the point - converging Confocal Max-Flux (CMF) Optic optics with an X-ray focusing mirror (multilayer film mirror), clean incoming high-intensity X-rays from 3 × 107 to 6 × 108 pulses per second (cps) are obtained (intensity varies depending on on the type of gap).

The alignment of the CMF Optic Converging Point Optics is very simple. To carry out a measurement under ideal conditions, 2 settings are sufficient: moving forward and backward along the axis and changing the angle of the incoming beam (θ).

Since the sample is close to the convergence point, the X-ray exposure area is small, so even small samples can be measured. Even capillaries, etc. samples, samples in cuvettes, for which a small X-ray exposure area is important, are measured without loss of intensity.

The length of the chamber (distance from the sample to the detector), depending on the tension or compression of the metal corrugated shell (change in the length of the vacuum passage), can vary from 400 mm to 700 mm.

Measuring range: it is possible to measure from a small angle 2θ=0.07°, q=0.05 nm-1 to a wide angle 2θ=45°, q=31.21 nm-1.
To avoid air dispersion, dispersion from the vacuum screen membrane, the slot system, the sample, and even the detector are placed completely in a vacuum.

Applications:
1. Nanotechnology
2. Polymers and gels
3. Biology
4. Environmental protection
 

Main technical characteristics: