SmartLab - a fully automatic X-ray diffractometer (XRD) for characterization of thin films with a horizontal arrangement of the test sample manufactured by RIGAKU (Japan)
For more than 50 years, the Japanese company Rigaku Corporation (Rigaku) has been specializing in the production of X-ray diffractometers. Thanks to experience, innovative design solutions, high level of production, RIGAKU has become a world leader in X-ray spectrometry, diffraction, X-ray optics and molecular and protein crystallography. A large number of models of devices manufactured by RIGAKU allow you to choose the one that best meets the needs of the user. This determines the great popularity of RIGAKU equipment all over the world.
The RIGAKU SmartLab diffractometer is a fully automated system for structural analysis, including a high-resolution vertical Theta-Theta gonimeter, parallel beam optics (CBO), goniometer arm rotation module for in-plane analysis, optional 9 kW X-ray tube. The Smartlab diffractometer is equipped with a fully automated optical system that allows both experts and inexperienced users to perform complex studies. The Rigaku SmartLab diffractometer is specifically designed to analyze thin films and nanomaterials, powders and liquids.
Simplicity is the main concept developed by RIGAKU in SmartLab X-ray diffraction system.
The main theses of this concept:
- a complex experiment should not mean the complexity of its implementation;
- an operator conducting, for example, measuring the thickness of a thin film, is not required to understand the reflectivity of x-rays;
- or, a specialist in the field of soil mineralogy is not required to know all the subtleties of the Rietveld refinement.
SmartLab, powered by Rigaku's Guidance™ software package, has introduced intelligent specialized protocols into all types of measurements, thereby increasing the ability of an inexperienced user to obtain high-quality analysis results with a minimum of pre-training and training costs. And for sophisticated users, SmartLab, with its full automation of the implemented methods, has become the key to maximum productivity and productivity.
CBO Technology: Modularity Without Modules
SmartLab is equipped with Rigaku's patented “Cross Beam Optics” (CBO) technology as standard. The optics assembled in one "SV" unit opens up the possibility of simultaneous use of two focusing schemes: a divergent (by Bragg-Brentano) and a parallel beam. The user can easily switch to one geometry or the other by simply rotating the optical module without the need for any other reconfiguration of the optical components.
Rigaku's patented Cross Beam Optics TM CBO is included as standard, and switching from a wide variety of standard optics is greatly simplified. In addition, Rigaku's proprietary adjustment function of the optical systems has been further improved, as the installation and alignment of various types of high-resolution optical systems is fully automated.
SmartLab makes thin film analysis more flexible
SmartLab supports the user in choosing the experimental conditions, survey geometry, and the most appropriate methods for each specific sample.
To set the most optimal sequence for measuring a sample, it is sufficient to enter only the film thickness and expected crystallinity estimated from the exposure data. Guidance software can be applied in the following thin film characterizations: compositional analysis, direction and orientation analysis, crystallinity characterization, lattice relaxation characterization, lattice deformation and residual stress characterization, film thickness analysis, interface roughness analysis, film density analysis, in-plane homogeneity characterization, etc. .d.
SmartLab simplifies the use of small angle X-ray scattering (SAXS)
With SmartLab's Guidance™ software module and "CB" optics, small-angle X-ray scattering data collection is easier than ever.
A detailed experimental-computational analysis of the small-angle X-ray scattering data is easily performed using the NANO - SolverTM software, which is Rigaku's own development.
The NANO - SolverTM software can be used in the following diverse measurements of small-angle X-ray scattering: experimental-computational analysis of the size distribution of nanoparticles of liquid dispersions, experimental-computational analysis of the size distribution of nanoparticles and pores in thin films and inside massive samples, characterization of the shape of nanoparticles and pores, experimentally - calculation analysis of the correlation function of the distribution of irregular electron density, etc.
SmartLab simplifies the use of powder diffraction methods
Automatic alignment, CBO and GuidanceTM software of the SmartLab X-ray diffraction system come together to create the ultimate in ease and flexibility built on an intelligent data acquisition platform.
SmartLab® provides support through a user-friendly on-screen dialog. Based on the available information about the sample, it proposes an optical measurement system, aligns the optical elements, sets the measurement conditions, then runs a sequence of processes until the measurement data is obtained. SmartLab® is used in various studies of powder samples: qualitative analysis, quantitative analysis, characterization of the degree of crystallinity, characterization of crystallite size / lattice distortion, lattice constant refinement, experimental Rietveld analysis, etc.
materials
x-ray tube |
Cu, power 3 kW, 9 kW (with rotating anode) |
Generator power |
9 kW |
Geometry of the goniometer |
Vertical, Theta-Theta |
Goniometer radius |
300 mm |
Minimum step 2 Theta |
0.0001° |
Divergence slots |
Automatic up to 20 mm |
Adjustment of X-ray optics |
Automatic |
