The company designs and manufactures a wide range of probe stations for control in semiconductor manufacturing and research. The systems are as accessible and easy to use as possible. Designed by MicroXact Inc. accurate and reliable analytical systems for probe measurements can be fully optimized for almost any task and customer requirements. Technically, probe stations can be designed for wafers up to 200 mm in diameter. and are configured for DC, RF, temperature and optical measurements in both manual and automatic modes.